Depth sectioning using electron energy loss spectroscopy

Depth sectioning using electron energy loss spectroscopy

The continued development of electron probe aberration correctors for scanning transmission electron microscopy has enabled finer electron probes, allowing atomic resolution column-by-column electron energy loss spectroscopy. Finer electron probes have also led to a decrease in the probe depth of fo...

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Sonraí bibleagrafaíochta
Príomhchruthaitheoirí:	D'Alfonso, A, Cosgriff, E, Findlay, S, Kirkland, A, Nellist, P, Oxley, M, Allen, L
Formáid:	Conference item
Foilsithe / Cruthaithe:	2008

Míreanna comhchosúla

Theoretical interpretation of electron energy-loss spectroscopic images
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Foilsithe / Cruthaithe: (2008)

Three-dimensional imaging and analysis by optical sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscopes
de réir: Nellist, P, et al.
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Three-dimensional imaging using aberration-corrected scanning transmission and confocal electron microscopy
de réir: Cosgriff, E, et al.
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Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, part I: elastic scattering.
de réir: Cosgriff, E, et al.
Foilsithe / Cruthaithe: (2008)

Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopt, Part I: elastic scattering
de réir: Cosgriff, E, et al.
Foilsithe / Cruthaithe: (2008)

Scanning confocal electron microscopy in a double aberration corrected transmission electron microscope
de réir: Nellist, P, et al.
Foilsithe / Cruthaithe: (2008)

Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, part II: inelastic scattering.
de réir: D'Alfonso, A, et al.
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Image Contrast in Aberration-Corrected Scanning Confocal Electron Microscopy
de réir: Cosgriff, E, et al.
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Simulating atomic resolution STEM images of non-periodic samples
de réir: Findlay, S, et al.
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Three-dimensional imaging by optical sectioning in the aberration-corrected scanning transmission electron microscope.
de réir: Behan, G, et al.
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Imaging modes for scanning confocal electron microscopy in a double aberration-corrected transmission electron microscope.
de réir: Nellist, P, et al.
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Bloch wave analysis of depth dependent strain effects in high resolution electron microscopy
de réir: Nellist, P, et al.
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Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope.
de réir: Wang, P, et al.
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A Bloch wave analysis of optical sectioning in aberration-corrected STEM.
de réir: Cosgriff, E, et al.
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Probing the bonding in nitrogen-doped graphene using electron energy loss spectroscopy.
de réir: Nicholls, R, et al.
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Prospects for 3D characterization of materials by aberration-corrected STEM and SCEM
de réir: Nellist, P, et al.
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Measuring the hole-state anisotropy in MgB2 by electron energy-loss spectroscopy
de réir: Klie, R, et al.
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Nanohalos: a manifestation of electron channelling in gold nanoparticles.
de réir: Ruben, G, et al.
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Optical depth sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscope
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Forecasting of in situ electron energy loss spectroscopy
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Energy Filtered Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope
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Measuring the hole-state anisotropy in MgB2 by electron energy-loss spectroscopy
de réir: Klie, Robert F., et al.
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Electron energy loss spectroscopy of fullerene materials
de réir: Nicholls, R
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Electron energy-loss spectroscopy of autoionizing states of zinc
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Experimental Setup for Energy-Filtered Scanning Confocal Electron Microscopy (EFSCEM) in a Double Aberration-Corrected Transmission Electron Microscope
de réir: Wang, P, et al.
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Aberration-corrected electron microscopy processing and imaging of novel organic and inorganic nanostructures
de réir: Nicolosi, V, et al.
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Aberration-corrected electron microscopy processing and imaging of novel organic and inorganic nanostructures
de réir: Nicolosi, V, et al.
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Deterministic electron ptychography at atomic resolution
de réir: D'Alfonso, A, et al.
Foilsithe / Cruthaithe: (2014)

Applications of the Oxford-JEOL aberration-corrected electron microscope
de réir: Nellist, P, et al.
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Electron energy loss spectroscopy for differentiating of minerals polymorphs
de réir: Roddatis Vladimir, et al.
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Electron energy-loss spectroscopy of branched gap plasmon resonators
de réir: Søren Raza, et al.
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Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy
de réir: Kirkland, A, et al.
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Comparison of simulation methods for electronic structure calculations with experimental electron energy-loss spectra.
de réir: Arslan, I, et al.
Foilsithe / Cruthaithe: (2003)

Photoemission and electron-energy-loss-spectroscopy study of BaRuO3.
de réir: Gulino, A, et al.
Foilsithe / Cruthaithe: (1995)

Automatic signal clasification of the Low-Loss Region in Electron Energy Loss Spectroscopy
de réir: Costa-Ledesma Vanessa, et al.
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Determination of the energy loss function of tungsten from reflection electron energy loss spectroscopy spectra
de réir: Z. Li, et al.
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Chapter 8 Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy
de réir: Kirkland, A, et al.
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Direct observation of depth-dependent atomic displacements associated with dislocations in gallium nitride.
de réir: Lozano, J, et al.
Foilsithe / Cruthaithe: (2014)

Quantitative techniques for aberration corrected HAADF STEM of nano-materials
de réir: E, H, et al.
Foilsithe / Cruthaithe: (2012)

Graphene nanowalls formation investigated by Electron Energy Loss Spectroscopy
de réir: Badri Vishal, et al.
Foilsithe / Cruthaithe: (2024-01-01)