Depth sectioning using electron energy loss spectroscopy
The continued development of electron probe aberration correctors for scanning transmission electron microscopy has enabled finer electron probes, allowing atomic resolution column-by-column electron energy loss spectroscopy. Finer electron probes have also led to a decrease in the probe depth of fo...
| Հիմնական հեղինակներ: | , , , , , , |
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| Ձևաչափ: | Conference item |
| Հրապարակվել է: |
2008
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