Depth sectioning using electron energy loss spectroscopy

Depth sectioning using electron energy loss spectroscopy

The continued development of electron probe aberration correctors for scanning transmission electron microscopy has enabled finer electron probes, allowing atomic resolution column-by-column electron energy loss spectroscopy. Finer electron probes have also led to a decrease in the probe depth of fo...

Бүрэн тодорхойлолт

Номзүйн дэлгэрэнгүй
Үндсэн зохиолчид:	D'Alfonso, A, Cosgriff, E, Findlay, S, Kirkland, A, Nellist, P, Oxley, M, Allen, L
Формат:	Conference item
Хэвлэсэн:	2008

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