Depth-resolved magnetization dynamics revealed by x-ray reflectometry ferromagnetic resonance
Magnetic multilayers offer diverse opportunities for the development of ultrafast functional devices through advanced interface and layer engineering. Nevertheless, a method for determining their dynamic properties as a function of depth throughout such stacks have remained elusive. By probing the f...
| Үндсэн зохиолчид: | , , , , , , , |
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| Формат: | Journal article |
| Хэл сонгох: | English |
| Хэвлэсэн: |
American Physical Society
2020
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