APA(7版)引用形式

Devynck, F., Giustino, F., Broqvist, P., & Pasquarello, A. (2007). Structural and electronic properties of an abrupt 4H-SiC(0001)/SiO2 interface model: Classical molecular dynamics simulations and density functional calculations.

Chicagoスタイル(17版)引用形式

Devynck, F., F. Giustino, P. Broqvist, , A. Pasquarello. Structural and Electronic Properties of an Abrupt 4H-SiC(0001)/SiO2 Interface Model: Classical Molecular Dynamics Simulations and Density Functional Calculations. 2007.

MLA(9版)引用形式

Devynck, F., et al. Structural and Electronic Properties of an Abrupt 4H-SiC(0001)/SiO2 Interface Model: Classical Molecular Dynamics Simulations and Density Functional Calculations. 2007.

警告: この引用は必ずしも正確ではありません.