Structural and electronic properties of an abrupt 4H-SiC(0001)/SiO2 interface model: Classical molecular dynamics simulations and density functional calculations
Main Authors: | Devynck, F, Giustino, F, Broqvist, P, Pasquarello, A |
---|---|
Format: | Journal article |
Udgivet: |
2007
|
Lignende værker
-
Abrupt model interface for the 4H(1000)SiC-SiO2 interface
af: Devynck, F, et al.
Udgivet: (2005) -
Atomistic model of the 4H(0001)SiC-SiO2 interface: structural and electronic properties
af: Devynck, F, et al.
Udgivet: (2007) -
Atomistic model of the 4H(0001)SiC-SiO2 interface: Structural and electronic properties
af: Devynck, F, et al.
Udgivet: (2007) -
Atomic-scale modelling of the Si(100)-SiO(2) interface
af: Giustino, F, et al.
Udgivet: (2005) -
Electronic structure at realistic Si(100)-SiO2 interfaces
af: Giustino, F, et al.
Udgivet: (2004)