Structural and electronic properties of an abrupt 4H-SiC(0001)/SiO2 interface model: Classical molecular dynamics simulations and density functional calculations

Structural and electronic properties of an abrupt 4H-SiC(0001)/SiO2 interface model: Classical molecular dynamics simulations and density functional calculations

Détails bibliographiques
Auteurs principaux:	Devynck, F, Giustino, F, Broqvist, P, Pasquarello, A
Format:	Journal article
Publié:	2007

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