Elastic mapping of heterogeneous nanostructures with ultrasonic force microscopy (UFM)
Ultrasonic force microscopy (UFM) is an atomic force microscopy (AFM)-related technique originally introduced to study the surface elastic properties of stiff materials. We report elastic images of heterogeneous nanostructures with a lateral resolution of the order of a few nanometers. One of the ma...
| Asıl Yazarlar: | , , , , |
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| Materyal Türü: | Journal article |
| Dil: | English |
| Baskı/Yayın Bilgisi: |
John Wiley and Sons Ltd
1999
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