HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysis.
A full coherent Bloch wave calculation is presented to investigate high-angle annular dark-field image formation for sub-angstrom probes in scanning transmission electron microscopy (STEM). With increasing illumination angle, the contribution of the 1s bound state increases to a maximum at an optimu...
| Main Authors: | , , |
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| Format: | Journal article |
| Language: | English |
| Published: |
2004
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