HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysis.
A full coherent Bloch wave calculation is presented to investigate high-angle annular dark-field image formation for sub-angstrom probes in scanning transmission electron microscopy (STEM). With increasing illumination angle, the contribution of the 1s bound state increases to a maximum at an optimu...
| Main Authors: | , , |
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| Format: | Journal article |
| Language: | English |
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2004
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| _version_ | 1797082815730286592 |
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| author | Peng, Y Nellist, P Pennycook, S |
| author_facet | Peng, Y Nellist, P Pennycook, S |
| author_sort | Peng, Y |
| collection | OXFORD |
| description | A full coherent Bloch wave calculation is presented to investigate high-angle annular dark-field image formation for sub-angstrom probes in scanning transmission electron microscopy (STEM). With increasing illumination angle, the contribution of the 1s bound state increases to a maximum at an optimum probe angle, after which we find increasing contributions from high-angle plane wave states around the periphery of the objective aperture. Examination of image contributions from different depths within a crystal shows an oscillatory behavior due to the beating between 1s and non-1s states. The oscillation period reduces with decreasing probe size, while the relative contribution from a specific depth increases. This signifies a changeover from a projection mode of imaging to a depth-slicing mode of imaging. This new mode appears capable of resolving three-dimensional atomic structures in future generation aberration-corrected STEM. |
| first_indexed | 2024-03-07T01:33:12Z |
| format | Journal article |
| id | oxford-uuid:94468829-b71c-4903-a4b0-ad5607a3c4ba |
| institution | University of Oxford |
| language | English |
| last_indexed | 2024-03-07T01:33:12Z |
| publishDate | 2004 |
| record_format | dspace |
| spelling | oxford-uuid:94468829-b71c-4903-a4b0-ad5607a3c4ba2022-03-26T23:38:16ZHAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysis.Journal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:94468829-b71c-4903-a4b0-ad5607a3c4baEnglishSymplectic Elements at Oxford2004Peng, YNellist, PPennycook, SA full coherent Bloch wave calculation is presented to investigate high-angle annular dark-field image formation for sub-angstrom probes in scanning transmission electron microscopy (STEM). With increasing illumination angle, the contribution of the 1s bound state increases to a maximum at an optimum probe angle, after which we find increasing contributions from high-angle plane wave states around the periphery of the objective aperture. Examination of image contributions from different depths within a crystal shows an oscillatory behavior due to the beating between 1s and non-1s states. The oscillation period reduces with decreasing probe size, while the relative contribution from a specific depth increases. This signifies a changeover from a projection mode of imaging to a depth-slicing mode of imaging. This new mode appears capable of resolving three-dimensional atomic structures in future generation aberration-corrected STEM. |
| spellingShingle | Peng, Y Nellist, P Pennycook, S HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysis. |
| title | HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysis. |
| title_full | HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysis. |
| title_fullStr | HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysis. |
| title_full_unstemmed | HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysis. |
| title_short | HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysis. |
| title_sort | haadf stem imaging with sub angstrom probes a full bloch wave analysis |
| work_keys_str_mv | AT pengy haadfstemimagingwithsubangstromprobesafullblochwaveanalysis AT nellistp haadfstemimagingwithsubangstromprobesafullblochwaveanalysis AT pennycooks haadfstemimagingwithsubangstromprobesafullblochwaveanalysis |