HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysis.

HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysis.

A full coherent Bloch wave calculation is presented to investigate high-angle annular dark-field image formation for sub-angstrom probes in scanning transmission electron microscopy (STEM). With increasing illumination angle, the contribution of the 1s bound state increases to a maximum at an optimu...

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Bibliographic Details
Main Authors:	Peng, Y, Nellist, P, Pennycook, S
Format:	Journal article
Language:	English
Published:	2004

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