Tunable threshold voltage of an n-type Si nanowire ferroelectric-gate field effect transistor for high-performance nonvolatile memory applications.

We successfully fabricated ferroelectric-gate field effect transistor (FEFET)-based nonvolatile memory devices using an n-type Si nanowire coated with omega-shaped-gate organic ferroelectric poly(vinylidene fluoride-trifluoroethylene) via a low-temperature fabrication process. Our FEFET memory devic...

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Bibliographic Details
Main Authors: Van, N, Lee, J, Sohn, J, Cha, S, Whang, D, Kim, J, Kang, D
Format: Journal article
Language:English
Published: Institute of Physics Publishing 2014