Tunable threshold voltage of an n-type Si nanowire ferroelectric-gate field effect transistor for high-performance nonvolatile memory applications.

We successfully fabricated ferroelectric-gate field effect transistor (FEFET)-based nonvolatile memory devices using an n-type Si nanowire coated with omega-shaped-gate organic ferroelectric poly(vinylidene fluoride-trifluoroethylene) via a low-temperature fabrication process. Our FEFET memory devic...

Full description

Bibliographic Details
Main Authors: Van, N, Lee, J, Sohn, J, Cha, S, Whang, D, Kim, J, Kang, D
Format: Journal article
Language:English
Published: Institute of Physics Publishing 2014
_version_ 1797082880637140992
author Van, N
Lee, J
Sohn, J
Cha, S
Whang, D
Kim, J
Kang, D
author_facet Van, N
Lee, J
Sohn, J
Cha, S
Whang, D
Kim, J
Kang, D
author_sort Van, N
collection OXFORD
description We successfully fabricated ferroelectric-gate field effect transistor (FEFET)-based nonvolatile memory devices using an n-type Si nanowire coated with omega-shaped-gate organic ferroelectric poly(vinylidene fluoride-trifluoroethylene) via a low-temperature fabrication process. Our FEFET memory devices with controllable threshold voltage via adjustment of the doping concentration exhibit excellent memory characteristics with ultra-low ON state power dissipation (≤3 nW), a large modulation in channel conductance between the ON and OFF states exceeding 10(5), a long retention time of over 3 × 10(4) s and a high endurance of over 10(5) programming cycles whilst maintaining an I ON/I OFF ratio higher than 10(3). This result may be promising for next-generation nonvolatile memory on flexible substrate applications.
first_indexed 2024-03-07T01:34:09Z
format Journal article
id oxford-uuid:949419c2-768a-4101-bd52-d1c33bab35a7
institution University of Oxford
language English
last_indexed 2024-03-07T01:34:09Z
publishDate 2014
publisher Institute of Physics Publishing
record_format dspace
spelling oxford-uuid:949419c2-768a-4101-bd52-d1c33bab35a72022-03-26T23:40:26ZTunable threshold voltage of an n-type Si nanowire ferroelectric-gate field effect transistor for high-performance nonvolatile memory applications.Journal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:949419c2-768a-4101-bd52-d1c33bab35a7EnglishSymplectic Elements at OxfordInstitute of Physics Publishing2014Van, NLee, JSohn, JCha, SWhang, DKim, JKang, DWe successfully fabricated ferroelectric-gate field effect transistor (FEFET)-based nonvolatile memory devices using an n-type Si nanowire coated with omega-shaped-gate organic ferroelectric poly(vinylidene fluoride-trifluoroethylene) via a low-temperature fabrication process. Our FEFET memory devices with controllable threshold voltage via adjustment of the doping concentration exhibit excellent memory characteristics with ultra-low ON state power dissipation (≤3 nW), a large modulation in channel conductance between the ON and OFF states exceeding 10(5), a long retention time of over 3 × 10(4) s and a high endurance of over 10(5) programming cycles whilst maintaining an I ON/I OFF ratio higher than 10(3). This result may be promising for next-generation nonvolatile memory on flexible substrate applications.
spellingShingle Van, N
Lee, J
Sohn, J
Cha, S
Whang, D
Kim, J
Kang, D
Tunable threshold voltage of an n-type Si nanowire ferroelectric-gate field effect transistor for high-performance nonvolatile memory applications.
title Tunable threshold voltage of an n-type Si nanowire ferroelectric-gate field effect transistor for high-performance nonvolatile memory applications.
title_full Tunable threshold voltage of an n-type Si nanowire ferroelectric-gate field effect transistor for high-performance nonvolatile memory applications.
title_fullStr Tunable threshold voltage of an n-type Si nanowire ferroelectric-gate field effect transistor for high-performance nonvolatile memory applications.
title_full_unstemmed Tunable threshold voltage of an n-type Si nanowire ferroelectric-gate field effect transistor for high-performance nonvolatile memory applications.
title_short Tunable threshold voltage of an n-type Si nanowire ferroelectric-gate field effect transistor for high-performance nonvolatile memory applications.
title_sort tunable threshold voltage of an n type si nanowire ferroelectric gate field effect transistor for high performance nonvolatile memory applications
work_keys_str_mv AT vann tunablethresholdvoltageofanntypesinanowireferroelectricgatefieldeffecttransistorforhighperformancenonvolatilememoryapplications
AT leej tunablethresholdvoltageofanntypesinanowireferroelectricgatefieldeffecttransistorforhighperformancenonvolatilememoryapplications
AT sohnj tunablethresholdvoltageofanntypesinanowireferroelectricgatefieldeffecttransistorforhighperformancenonvolatilememoryapplications
AT chas tunablethresholdvoltageofanntypesinanowireferroelectricgatefieldeffecttransistorforhighperformancenonvolatilememoryapplications
AT whangd tunablethresholdvoltageofanntypesinanowireferroelectricgatefieldeffecttransistorforhighperformancenonvolatilememoryapplications
AT kimj tunablethresholdvoltageofanntypesinanowireferroelectricgatefieldeffecttransistorforhighperformancenonvolatilememoryapplications
AT kangd tunablethresholdvoltageofanntypesinanowireferroelectricgatefieldeffecttransistorforhighperformancenonvolatilememoryapplications