Residual gas effects on the emission characteristics of silicon field emitter arrays
Measurements have been performed on the degradation of emission from silicon field emitting devices in ultrahigh vacuum (UHV) and vacuums containing CO2 and CH4 with anode potentials of 0 and 2500 V. Degradation is very fast in CO2, slower in CH4, and very slow in UHV. Analysis of the data using a n...
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American Inst of Physics
2000
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