Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopt, Part I: elastic scattering
A transmission electron microscope fitted with both pre-specimen and post-specimen spherical aberration correctors enables the possibility of aberration-corrected scanning confocal electron microscopy. Imaging modes available in this configuration can make use of either elastically or inelastically...
Main Authors: | , , , , , |
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Format: | Journal article |
Language: | English |
Published: |
Elsevier
2008
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Subjects: |