Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopt, Part I: elastic scattering

A transmission electron microscope fitted with both pre-specimen and post-specimen spherical aberration correctors enables the possibility of aberration-corrected scanning confocal electron microscopy. Imaging modes available in this configuration can make use of either elastically or inelastically...

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Bibliographic Details
Main Authors: Cosgriff, E, D'Alfonso, A, Allen, L, Findlay, S, Kirkland, A, Nellist, P
Format: Journal article
Language:English
Published: Elsevier 2008
Subjects: