Investigation of grain boundaries for abnormal grain growth in polycrystalline SrTiO
Strontium titanate (SrTiO) is widely used in electronic devices, and it is a model material for understanding the structural and dielectric properties of grain boundaries (GBs). In such materials, the GBs often play a dominant role in sintering and microstructural behavior. Abnormal grain growth (AG...
Main Authors: | Shin, S, Lozano-Perez, S, Cockayne, D |
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פורמט: | Journal article |
יצא לאור: |
2010
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פריטים דומים
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