Characterizing dislocation structure evolution during cyclic deformation using electron channelling contrast imaging

This paper briefly reviews development of the electron channelling contrast imaging (ECCI) technique, which uses diffraction contrast to reveal dislocation structures underlying the surface of bulk samples imaged in the scanning electron microscope. In particular, the application of ECCI to the stud...

詳細記述

書誌詳細
主要な著者: Ahmed, J, Roberts, S, Wilkinson, A
フォーマット: Journal article
言語:English
出版事項: 2006