Characterizing dislocation structure evolution during cyclic deformation using electron channelling contrast imaging
This paper briefly reviews development of the electron channelling contrast imaging (ECCI) technique, which uses diffraction contrast to reveal dislocation structures underlying the surface of bulk samples imaged in the scanning electron microscope. In particular, the application of ECCI to the stud...
| Հիմնական հեղինակներ: | , , |
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| Ձևաչափ: | Journal article |
| Լեզու: | English |
| Հրապարակվել է: |
2006
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