An Aberration-Corrected STEM for Diffraction Studies.
Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005.
Bibliographic Details
| Main Authors: |
Krivanek, O,
Dellby, N,
McManama-Smith, A,
Murfitt, M,
Nellist, P,
Own, C |
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| Format: | Journal article
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| Language: | English |
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| Published: |
2005
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