$An Aberration-Corrected STEM for Diffraction Studies.$

An Aberration-Corrected STEM for Diffraction Studies.

Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005.

Bibliographic Details
Main Authors:	Krivanek, O, Dellby, N, McManama-Smith, A, Murfitt, M, Nellist, P, Own, C
Format:	Journal article
Language:	English
Published:	2005

Description
Summary:	Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005.

Similar Items