Plasma emission spectroscopy of solids irradiated by intense XUV pulses from a free electron laser
The FLASH XUV-free electron laser has been used to irradiate solid samples at intensities of the order 1016 W cm-2 at a wavelength of 13.5 nm. The subsequent time integrated XUV emission was observed with a grating spectrometer. The electron temperature inferred from plasma line ratios was in the ra...
| Main Authors: | , , , , , , , , , , , , , , , , , , , , , |
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| Format: | Journal article |
| Language: | English |
| Published: |
2010
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