A new method for the determination of the wave aberration function for high-resolution TEM.; 2. Measurement of the antisymmetric aberrations.
A new method is presented for the determination of the antisymmetric coefficients of the wave aberration function from a tableau of tilted illumination images. The approach is based on measurements of the apparent defocus and two-fold astigmatism using a phase correlation function and phase contrast...
Main Authors: | Meyer, R, Kirkland, A, Saxton, W |
---|---|
格式: | Journal article |
语言: | English |
出版: |
2004
|
相似书籍
-
A new method for the determination of the wave aberration function for high resolution TEM 1. Measurement of the symmetric aberrations.
由: Meyer, R, et al.
出版: (2002) -
High resolution imaging using the Oxford aberration corrected TEM
由: Hetherington, C, et al.
出版: (2006) -
High-resolution TEM and the application of direct and indirect aberration correction.
由: Hetherington, C, et al.
出版: (2008) -
"Indirect" high-resolution transmission electron microscopy: Aberration measurement and wavefunction reconstruction
由: Kirkland, A, et al.
出版: (2004) -
"Indirect" high-resolution transmission electron microscopy: aberration measurement and wavefunction reconstruction.
由: Kirkland, A, et al.
出版: (2004)