Calculations of spherical aberration-corrected imaging behaviour.
Different optimal operating conditions for a C3-corrected transmission electron microscope were compared for both conventional field emission sources and for the next generation of monochromated instruments. In particular, the contrast transfer functions and corresponding wave aberration functions f...
主要な著者: | Chang, L, Chen, F, Kirkland, A, Kai, J |
---|---|
フォーマット: | Journal article |
言語: | English |
出版事項: |
2003
|
類似資料
-
On the importance of fifth-order spherical aberration for a fully corrected electron microscope.
著者:: Chang, L, 等
出版事項: (2006) -
The application of spherical aberration correction and focal series restoration to high-resolution images of platinum nanocatalyst particles
著者:: Gontard, L, 等
出版事項: (2006) -
Aberration-Corrected Imaging in CTEM
著者:: Haigh, S, 等
出版事項: (2011) -
Spherical Aberration-Corrected Metalens for Polarization Multiplexed Imaging
著者:: Shaodong Zhou, 等
出版事項: (2021-10-01) -
Experimental evaluation of a spherical aberration-corrected TEM and STEM.
著者:: Sawada, H, 等
出版事項: (2005)