Data for "Efficient Characterization of Qudit Logical Gates with Gate Set Tomography Using an Error-Free Virtual Z Gate Model"

Data for "Efficient Characterization of Qudit Logical Gates with Gate Set Tomography Using an Error-Free Virtual Z Gate Model"

Bibliografski detalji
Glavni autor: Cao, S
Format: Dataset
Jezik:English
Izdano: University of Oxford 2024