Data for "Efficient Characterization of Qudit Logical Gates with Gate Set Tomography Using an Error-Free Virtual Z Gate Model"

Data for "Efficient Characterization of Qudit Logical Gates with Gate Set Tomography Using an Error-Free Virtual Z Gate Model"

Data for "Efficient Characterization of Qudit Logical Gates with Gate Set Tomography Using an Error-Free Virtual Z Gate Model"

Bibliographic Details
Main Author:	Cao, S
Format:	Dataset
Language:	English
Published:	University of Oxford 2024

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