Fabrication and measurement of intrinsic Josephson junctions in misaligned films of Tl2Ba2CaCu2O8

Fabrication and measurement of intrinsic Josephson junctions in misaligned films of Tl2Ba2CaCu2O8

Instrinsic Josephson bridges have been patterned in films of Tl2Ba2CaCu2O8. Due to our device geometry we have used films that are misaligned at 20 degrees to the substrate surface. This misalignment has been confirmed using four-circle x-ray diffraction and cross-sectional transmission electron mic...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς:	Chana, O, Kuzhakhmetov, A, Hyland, D, Eastell, C, Dew-Hughes, D, Grovenor, C, Koval, Y, Mossle, M, Kleiner, R, Muller, P, Warburton, P
Μορφή:	Conference item
Έκδοση:	2001

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