Structure of liquid Al2O3 from a computer simulation model
The combination of new containerless sample and high intensity synchrotron source technologies has enabled the X-ray diffraction pattern from a molten oxide (Al2O3) to be determined for the first time (Ansell et al. Phys. Rev. Lett. 1997, 78, 464).1 Here we show that the liquid-state diffraction pat...
| Päätekijät: | , , |
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| Aineistotyyppi: | Journal article |
| Kieli: | English |
| Julkaistu: |
1999
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