Topographical, compositional, and dopant contrast from cleavage surfaces of GaAs-AlxGa1-xAs superlattices
We present images of (110) cleavage surfaces of GaAs-AlxGa1-xAs superlattices obtained by scanning force microscopy (SFM) and field-emission scanning electron microscopy. Topographical information is mapped by secondary electrons (SEs) and SFM, compositional differences are imaged through SEs and ba...
| Príomhchruthaitheoirí: | , , , , , |
|---|---|
| Formáid: | Conference item |
| Foilsithe / Cruthaithe: |
1995
|