$Assessing the precision of strain measurements using electron backscatter diffraction - part 1: Detector assessment$

Assessing the precision of strain measurements using electron backscatter diffraction - part 1: Detector assessment

عرض إصدارات أخرى (1)

We analyse the link between precision of pattern shift measurements and the resolution of the measurement of elastic strain and lattice rotation using high resolution electron backscatter diffraction (HR-EBSD). This study combines analysis of high quality experimentally obtained diffraction patterns...

وصف كامل

التفاصيل البيبلوغرافية
المؤلفون الرئيسيون:	Britton, T, Jiang, J, Clough, R, Tarleton, E, Kirkland, A, Wilkinson, A
التنسيق:	Journal article
اللغة:	English
منشور في:	2013

مواد مشابهة

Assessing the precision of strain measurements using electron backscatter diffraction--part 1: detector assessment.
حسب: Britton, T, وآخرون
منشور في: (2013)

Assessing the precision of strain measurements using electron backscatter diffraction--part 2: experimental demonstration.
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Assessing the precision of strain measurements using electron backscatter diffraction - Part 2: Experimental demonstration
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Direct detection of electron backscatter diffraction patterns.
حسب: Wilkinson, A, وآخرون
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High resolution electron backscatter diffraction measurements of elastic strain variations in the presence of larger lattice rotations.
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Measurement of geometrically necessary dislocation density with high resolution electron backscatter diffraction: effects of detector binning and step size.
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High resolution mapping of strains and rotations using electron backscatter diffraction
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The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements
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Crystal orientation and detector distance effects on resolving pseudosymmetry by electron backscatter diffraction
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Electron backscatter diffraction study of dislocation content of a macrozone in hot-rolled Ti-6Al-4V alloy
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Electron backscatter diffraction study of dislocation content of a macrozone in hot-rolled Ti-6Al-4V alloy
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Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns.
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Electron backscatter diffraction in materials characterization
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Strain measurement using electron back scatter diffraction
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Direct Detectors for Electron Microscopy
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