$Assessing the precision of strain measurements using electron backscatter diffraction - part 1: Detector assessment$

Assessing the precision of strain measurements using electron backscatter diffraction - part 1: Detector assessment

Toon andere (1) versies

We analyse the link between precision of pattern shift measurements and the resolution of the measurement of elastic strain and lattice rotation using high resolution electron backscatter diffraction (HR-EBSD). This study combines analysis of high quality experimentally obtained diffraction patterns...

Volledige beschrijving

Bibliografische gegevens
Hoofdauteurs:	Britton, T, Jiang, J, Clough, R, Tarleton, E, Kirkland, A, Wilkinson, A
Formaat:	Journal article
Taal:	English
Gepubliceerd in:	2013

Gelijkaardige items

Assessing the precision of strain measurements using electron backscatter diffraction--part 1: detector assessment.
door: Britton, T, et al.
Gepubliceerd in: (2013)

Assessing the precision of strain measurements using electron backscatter diffraction--part 2: experimental demonstration.
door: Britton, T, et al.
Gepubliceerd in: (2013)

Assessing the precision of strain measurements using electron backscatter diffraction - Part 2: Experimental demonstration
door: Britton, T, et al.
Gepubliceerd in: (2013)

Direct detection of electron backscatter diffraction patterns.
door: Wilkinson, A, et al.
Gepubliceerd in: (2013)

Measurement of residual elastic strain and lattice rotations with high resolution electron backscatter diffraction.
door: Britton, T, et al.
Gepubliceerd in: (2011)

High resolution electron backscatter diffraction measurements of elastic strain variations in the presence of larger lattice rotations.
door: Britton, T, et al.
Gepubliceerd in: (2012)

Measurement of geometrically necessary dislocation density with high resolution electron backscatter diffraction: effects of detector binning and step size.
door: Jiang, J, et al.
Gepubliceerd in: (2013)

Measurement of plastic strain of polycrystalline material by electron backscatter diffraction
door: Kamaya, M, et al.
Gepubliceerd in: (2005)

Strain mapping using electron backscatter diffraction
door: Wilkinson, A, et al.
Gepubliceerd in: (2009)

Elastic strain tensor measurement using electron backscatter diffraction in the SEM.
door: Dingley, D, et al.
Gepubliceerd in: (2010)

The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements.
door: Tong, V, et al.
Gepubliceerd in: (2015)

Pattern matching analysis of electron backscatter diffraction patterns for pattern centre, crystal orientation and absolute elastic strain determination – accuracy and precision assessment
door: Tanaka, T, et al.
Gepubliceerd in: (2019)

Methods for determining elastic strains from electron backscatter diffraction and electron channelling patterns
door: Wilkinson, A
Gepubliceerd in: (1997)

High resolution mapping of strains and rotations using electron backscatter diffraction
door: Wilkinson, A, et al.
Gepubliceerd in: (2013)

High resolution mapping of strains and rotations using electron backscatter diffraction
door: Wilkinson, A, et al.
Gepubliceerd in: (2006)

High resolution measurements of strain and tilt distributions in SiGe mesas using electron backscatter diffraction
door: Wilkinson, A
Gepubliceerd in: (2006)

High resolution measurements of strain and tilt distributions in SiGe mesas using electron backscatter diffraction
door: Wilkinson, A
Gepubliceerd in: (2006)

Quantification of plastic strain of stainless steel and nickel alloy by electron backscatter diffraction
door: Kamaya, M, et al.
Gepubliceerd in: (2006)

High-resolution elastic strain measurement from electron backscatter diffraction patterns: new levels of sensitivity.
door: Wilkinson, A, et al.
Gepubliceerd in: (2006)

Analysis of dislocation densities using high resolution electron backscatter diffraction
door: Vilalta-Clemente, A, et al.
Gepubliceerd in: (2015)

High-resolution electron backscatter diffraction: an emerging tool for studying local deformation
door: Wilkinson, A, et al.
Gepubliceerd in: (2010)

Rapid electron backscatter diffraction mapping: painting by numbers
door: Tong, V, et al.
Gepubliceerd in: (2018)

The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements
door: Tong, V, et al.
Gepubliceerd in: (2015)

Crystal orientation and detector distance effects on resolving pseudosymmetry by electron backscatter diffraction
door: Pang, Edward L, et al.
Gepubliceerd in: (2022)

Crystal orientation and detector distance effects on resolving pseudosymmetry by electron backscatter diffraction
door: Pang, Edward L., et al.
Gepubliceerd in: (2022)

Probing deformation and revealing microstructural mechanisms with cross-correlation-based, high-resolution electron backscatter diffraction
door: Britton, T, et al.
Gepubliceerd in: (2013)

Geometrically necessary dislocation densities in olivine obtained using high-angular resolution electron backscatter diffraction
door: Wallis, D, et al.
Gepubliceerd in: (2016)

High-angular resolution electron backscatter diffraction as a new tool for mapping lattice distortion in geological minerals
door: Wallis, D, et al.
Gepubliceerd in: (2019)

J-integral analysis of the elastic strain fields of ferrite deformation twins using electron backscatter diffraction
door: Koko, A, et al.
Gepubliceerd in: (2021)

Electron backscatter diffraction in the silicon nanowires
door: K.K. Dikhanbayev, et al.
Gepubliceerd in: (2016-10-01)

Electron backscatter diffraction study of dislocation content of a macrozone in hot-rolled Ti-6Al-4V alloy
door: Britton, T, et al.
Gepubliceerd in: (2010)

Electron backscatter diffraction study of dislocation content of a macrozone in hot-rolled Ti-6Al-4V alloy
door: Britton, T, et al.
Gepubliceerd in: (2010)

In situ characterisation of the strain fields of intragranular slip bands in ferrite by high-resolution electron backscatter diffraction
door: Koko, A, et al.
Gepubliceerd in: (2022)

Measurement of fatigue crack plastic zones in fine grained materials using electron backscattered diffraction
door: Tucker, A, et al.
Gepubliceerd in: (2000)

Measurement of fatigue crack plastic zones in fine grained materials using electron backscattered diffraction
door: Tucker, A, et al.
Gepubliceerd in: (2000)

Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns.
door: Britton, T, et al.
Gepubliceerd in: (2010)

Electron backscatter diffraction in materials characterization
door: Dejan Stojakovic
Gepubliceerd in: (2012-03-01)

Strain measurement using electron back scatter diffraction
door: Wilkinson, A
Gepubliceerd in: (1998)

High-resolution electron backscatter diffraction in III-nitride semiconductors
door: Vilalta-Clemente, A, et al.
Gepubliceerd in: (2015)

Direct Detectors for Electron Microscopy
door: Clough, R, et al.
Gepubliceerd in: (2014)