Assessing the precision of strain measurements using electron backscatter diffraction - part 1: Detector assessment

We analyse the link between precision of pattern shift measurements and the resolution of the measurement of elastic strain and lattice rotation using high resolution electron backscatter diffraction (HR-EBSD). This study combines analysis of high quality experimentally obtained diffraction patterns...

Deskribapen osoa

Xehetasun bibliografikoak
Egile Nagusiak: Britton, T, Jiang, J, Clough, R, Tarleton, E, Kirkland, A, Wilkinson, A
Formatua: Journal article
Hizkuntza:English
Argitaratua: 2013