Accurate evaluation of aberration for probe-forming system and influence of aberration on high-resolution STEM image
The influence of residual three-fold astigmatism on high-resolution STEM imaging of graphene has been investigated. The aberration was measured by the segmented Ronchigram auto-correlation function method using the graphene lattice. In the presence of residual threefold astigmatism the graphene latt...
| Հիմնական հեղինակներ: | , , |
|---|---|
| Ձևաչափ: | Conference item |
| Հրապարակվել է: |
Insitute of Physics
2017
|