Sawada, H., Hosokawa, F., & Kirkland, A. (2017). Accurate evaluation of aberration for probe-forming system and influence of aberration on high-resolution STEM image. Insitute of Physics.
Chicago Style (17th ed.) CitationSawada, H., F. Hosokawa, and A. Kirkland. Accurate Evaluation of Aberration for Probe-forming System and Influence of Aberration on High-resolution STEM Image. Insitute of Physics, 2017.
ציטוט MLASawada, H., et al. Accurate Evaluation of Aberration for Probe-forming System and Influence of Aberration on High-resolution STEM Image. Insitute of Physics, 2017.
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