SURFACE SEGREGATION OF SR IN DOPED MGO - COMPARISON BETWEEN X-RAY PHOTOELECTRON-SPECTROSCOPY AND ATOMISTIC IONIC MODEL SIMULATIONS
The surface coverage of Sr on doped MgO ceramics has been measured by angle-resolved X-ray photoelectron spectroscopy (XPS) for bulk doping levels in the range 3-1000 ppm. The experimental data are compared with results derived from atomistic simulations of the doped surface. At low doping levels Sr...
| Main Authors: | , , , , |
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| 格式: | Journal article |
| 語言: | English |
| 出版: |
1991
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