The development and applications of STEM ptychography using direct electron detectors
<p>Since the introduction of direct electron detectors to scanning transmission electron microscopy (STEM), electron ptychography - a technique which utilises the interference in diffraction patterns to reconstruct the sample-induced phase changes of a transmitted electron wave - has significa...
| 主要作者: | |
|---|---|
| 其他作者: | |
| 格式: | Thesis |
| 语言: | English |
| 出版: |
2020
|
| 主题: |