The development and applications of STEM ptychography using direct electron detectors

<p>Since the introduction of direct electron detectors to scanning transmission electron microscopy (STEM), electron ptychography - a technique which utilises the interference in diffraction patterns to reconstruct the sample-induced phase changes of a transmitted electron wave - has significa...

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Bibliografski detalji
Glavni autor: O'Leary, C
Daljnji autori: Nellist, P
Format: Disertacija
Jezik:English
Izdano: 2020
Teme: