The development and applications of STEM ptychography using direct electron detectors

<p>Since the introduction of direct electron detectors to scanning transmission electron microscopy (STEM), electron ptychography - a technique which utilises the interference in diffraction patterns to reconstruct the sample-induced phase changes of a transmitted electron wave - has significa...

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Autore principale: O'Leary, C
Altri autori: Nellist, P
Natura: Tesi
Lingua:English
Pubblicazione: 2020
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