The development and applications of STEM ptychography using direct electron detectors

<p>Since the introduction of direct electron detectors to scanning transmission electron microscopy (STEM), electron ptychography - a technique which utilises the interference in diffraction patterns to reconstruct the sample-induced phase changes of a transmitted electron wave - has significa...

Полное описание

Библиографические подробности
Главный автор: O'Leary, C
Другие авторы: Nellist, P
Формат: Диссертация
Язык:English
Опубликовано: 2020
Предметы: