X-ray spectroscopy for the magnetic study of the van der Waals ferromagnet CrSiTe3 in the few- and monolayer limit
<p>The study of magnetic order in few- and monolayer van der Waals materials poses a challenge to the most commonly employed magnetic characterization techniques as they normally lack magnetic sensitivity and/or lateral resolution enabling their thickness-dependent probing. Here we demonstrate...
| Үндсэн зохиолчид: | , , , , , , |
|---|---|
| Формат: | Journal article |
| Хэл сонгох: | English |
| Хэвлэсэн: |
IOP Publishing
2022
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