Nanometrology for synchrotron X-ray mirrors
<p>Key challenges for developing nanometrology are achieving high precision and accuracy under stringent environmental control to mitigate the impact of temperature, humidity, turbulence, and vibration. Additional complexities arise in accommodating the peculiarities of material behaviour at t...
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Thesis |
| Language: | English |
| Published: |
2024
|
| Subjects: |