Imaging insulating oxides by elevated-temperature STM
By using elevated-temperature scanning tunnelling microscopy (STM) we have imaged the UO2(111), UO2(110), and NiO(001) surfaces, and have obtained atomic resolution data that are comparable in quality with images of other oxides that can be imaged at room temperature. Electronic structure modelling...
| Main Authors: | , , , , , |
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| Format: | Conference item |
| Published: |
1998
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