EBIC INVESTIGATIONS OF DISLOCATIONS AND THEIR INTERACTIONS WITH IMPURITIES IN SILICON

Eitemau Tebyg

• QUANTITATIVE EBIC INVESTIGATIONS OF DEFORMATION-INDUCED AND COPPER DECORATED DISLOCATIONS IN SILICON
  gan: Fell, T, et al.
  Cyhoeddwyd: (1991)
• QUANTITATIVE EBIC INVESTIGATIONS OF DEFORMATION-INDUCED AND COPPER DECORATED DISLOCATIONS IN SILICON
  gan: Fell, T, et al.
  Cyhoeddwyd: (1991)
• AN EBIC INVESTIGATION OF ALPHA, BETA AND SCREW DISLOCATIONS IN GALLIUM-ARSENIDE
  gan: Galloway, S, et al.
  Cyhoeddwyd: (1993)
• An SEM EBIC study of the electronic properties of dislocations in silicon
  gan: Wilshaw, P, et al.
  Cyhoeddwyd: (1984)
• TEMPERATURE DEPENDENCE OF EBIC CONTRAST FROM INDIVIDUAL DISLOCATIONS IN SILICON.
  gan: Ourmazd, A, et al.
  Cyhoeddwyd: (1983)