Electrical breakdown of suspended mono- and few-layer tungsten disulfide via sulfur depletion identified by in situ atomic imaging

Electrical breakdown of suspended mono- and few-layer tungsten disulfide via sulfur depletion identified by in situ atomic imaging

The high-bias and breakdown behavior of suspended mono- and few-layer WS2 was explored by in situ aberration-corrected transmission electron microscopy. The suspended WS2 devices were found to undergo irreversible breakdown at sufficiently high biases due to vaporization of the WS2. Simultaneous to...

書誌詳細
主要な著者:	Fan, Y, Robertson, A, Zhou, Y, Chen, Q, Zhang, X, Browning, N, Zheng, H, Rümmeli, M, Warner, J
フォーマット:	Journal article
言語:	English
出版事項:	American Chemical Society 2017

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