Applications of focal-series data in scanning-transmission electron microscopy
<p>Since its development, the scanning transmission electron microscope has rapidly found uses right across the material sciences. Its use of a finely focussed electron probe rastered across samples offers the microscopist a variety of imaging and spectroscopy signals in parallel. These signal...
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| Aineistotyyppi: | Opinnäyte |
| Kieli: | English |
| Julkaistu: |
2013
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