Measuring isoplanaticity in high-resolution electron microscopy

Measuring isoplanaticity in high-resolution electron microscopy

We recently reported on a new method for the accurate determination of the symmetric aberration coefficients (defocus and twofold astigmatism) from a focal series of high resolution images based on an analysis of the image Fourier transform phases. This can be extended to also cover the antisymmetri...

Deskribapen osoa

Xehetasun bibliografikoak
Egile Nagusiak:	Meyer, R, Kirkland, A
Formatua:	Conference item
Argitaratua:	2004

Antzeko izenburuak

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