Measuring isoplanaticity in high-resolution electron microscopy
We recently reported on a new method for the accurate determination of the symmetric aberration coefficients (defocus and twofold astigmatism) from a focal series of high resolution images based on an analysis of the image Fourier transform phases. This can be extended to also cover the antisymmetri...
| Main Authors: | , |
|---|---|
| פורמט: | Conference item |
| יצא לאור: |
2004
|