Measuring isoplanaticity in high-resolution electron microscopy

Measuring isoplanaticity in high-resolution electron microscopy

We recently reported on a new method for the accurate determination of the symmetric aberration coefficients (defocus and twofold astigmatism) from a focal series of high resolution images based on an analysis of the image Fourier transform phases. This can be extended to also cover the antisymmetri...

書誌詳細
主要な著者:	Meyer, R, Kirkland, A
フォーマット:	Conference item
出版事項:	2004

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