Finding phase information in the darkness
High resolution local structure information is revealed when the complex exit wavefunction is restored from a series of transmission electron microscope (TEM) images. Aberration corrected image data sets allow high spatial frequency information to be restored but this is often at the expense of lowe...
| Главные авторы: | , |
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| Формат: | Conference item |
| Опубликовано: |
2010
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