Skip to content
VuFind
English
Deutsch
Español
Français
Italiano
日本語
Nederlands
Português
Português (Brasil)
中文(简体)
中文（繁體）
Türkçe
עברית
Gaeilge
Cymraeg
Ελληνικά
Català
Euskara
Русский
Čeština
Suomi
Svenska
polski
Dansk
slovenščina
اللغة العربية
বাংলা
Galego
Tiếng Việt
Hrvatski
हिंदी
Հայերէն
Українська
Sámegiella
Монгол
Language
All Fields
Title
Author
Subject
Call Number
ISBN/ISSN
Tag
Find
Advanced
IMAGING OF LOW-LOAD INDENTATIO...
Cite this
Text this
Email this
Print
Export Record
Export to RefWorks
Export to EndNoteWeb
Export to EndNote
Permanent link
IMAGING OF LOW-LOAD INDENTATIONS INTO SI AND GAAS BY SCANNING TUNNELING MICROSCOPY
Bibliographic Details
Main Authors:
Castell, M
,
Walls, M
,
Howie, A
Format:
Journal article
Published:
1992
Holdings
Description
Similar Items
Staff View
Similar Items
Fracture properties of GaAs-AlAs superlattices studied by atomic force microscopy and scanning electron microscopy
by: Castell, M, et al.
Published: (1998)
INDENTATION PLASTICITY OF SINGLE AND MULTIPLE LAYER GAAS-ALAS HETEROSTRUCTURES
by: Castell, M, et al.
Published: (1993)
SCANNING TUNNELING MICROSCOPY OF NANOINDENTATIONS
by: Castell, M, et al.
Published: (1992)
The indentation response of GaAs-AlAs heterostructures
by: Castell, M, et al.
Published: (1996)
Scanning tunnelling microscopy of epitaxial nanostructures.
by: Marshall, MS, et al.
Published: (2014)